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Speed up build tests by only building each test to the ELF output stage (when all files are compiled and linked), rather than to the full HEX output stage as the resulting binary is not actually required.
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@@ -37,21 +37,21 @@ end:
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@echo
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%.avr8:
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$(MAKE) -f makefile.avr8 clean -s
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$(MAKE) -f makefile.avr8 all MCU=$(@:%.avr8=%) -s
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$(MAKE) -s -f makefile.avr8 clean
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$(MAKE) -s -f makefile.avr8 all MCU=$(@:%.avr8=%) elf
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%.xmega:
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$(MAKE) -f makefile.xmega clean -s
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$(MAKE) -f makefile.xmega all MCU=$(@:%.xmega=%) -s
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$(MAKE) -s -f makefile.xmega clean
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$(MAKE) -s -f makefile.xmega all MCU=$(@:%.xmega=%) elf
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%.uc3:
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$(MAKE) -f makefile.uc3 clean -s
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$(MAKE) -f makefile.uc3 all MCU=$(@:%.uc3=%) -s
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$(MAKE) -s -f makefile.uc3 clean
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$(MAKE) -s -f makefile.uc3 all MCU=$(@:%.uc3=%) elf
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clean:
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$(MAKE) -f makefile.avr8 clean -s
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$(MAKE) -f makefile.xmega clean -s
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$(MAKE) -f makefile.uc3 clean -s
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$(MAKE) -s -f makefile.avr8 clean
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$(MAKE) -s -f makefile.xmega clean
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$(MAKE) -s -f makefile.uc3 clean
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%:
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